Dopants
A Few Elements Set Every Transistor's Behavior
Doping places boron, phosphorus and arsenic atoms in chosen regions of the silicon to set how each region conducts.
| Dopant | Type | Typical use |
|---|---|---|
| Boron (B) | p-type | PMOS source and drain, p-wells, threshold adjust; also grown into p-type wafers |
| Phosphorus (P) | n-type | n-wells, NMOS extensions, light n-type doping |
| Arsenic (As) | n-type, heavy | Deep NMOS source and drain, n+ contacts; diffuses less than phosphorus |
| Antimony (Sb) | n-type, heavy | n+ substrates under epitaxial layers, bipolar buried layers |
| Indium (In) | p-type | Shallow p-type regions where boron spreads too far |
| Germanium, carbon (Ge, C) | Not dopants | Pre-amorphization and diffusion control before shallow boron implants |
| Aluminum, nitrogen (Al, N) | p-type and n-type in SiC | Silicon carbide power devices |
Pure silicon conducts poorly. Replacing a few silicon atoms per million with boron, phosphorus or arsenic sets the conductivity of each region to the level the circuit needs, and the source, drain, wells and threshold of every transistor are defined by where those atoms land.
Methods
Ion Implantation Replaced Diffusion for Patterned Doping
| Method | How it works | Where it is used |
|---|---|---|
| During crystal growth | Dopant is melted into the silicon before a Czochralski ingot is pulled | Sets the starting p-type or n-type doping of the whole wafer |
| Ion implantation | Ionized dopant is accelerated and fired into the wafer at a set energy and dose | Nearly all patterned doping in CMOS |
| Plasma doping (PLAD) | Wafer sits in a dopant plasma; ions arrive from all angles at low energy | Ultra-shallow and conformal doping of fins, nanosheets and 3D NAND |
| In-situ doping in epitaxy | Dopant gas is added while a crystalline layer grows | SiGe:B and Si:P source and drain in FinFET and GAA; SiC and power drift layers |
| In-situ doping in deposition | Dopant gas is added while polysilicon is deposited | Doped polysilicon gates and 3D NAND channels |
| Thermal diffusion | Dopant source at high temperature diffuses into the surface | Older processes, solar cells and some power devices |
Ion implantation took over from diffusion in the 1970s because it decouples the two things a designer cares about: energy sets depth, and dose sets concentration. Both are measured electrically during the implant, so the result can be repeated wafer after wafer. Wafer-level doping from crystal growth and epitaxy is covered on Crystal Growing and Epi, SOI and Float Zone.
Ion implantation
Energy Sets Depth and Dose Sets Concentration
| Class | Energy | Typical work |
|---|---|---|
| High current | Below 1 keV to tens of keV; high dose | Source and drain, contacts, poly gate doping |
| Medium current | Several keV to hundreds of keV; moderate dose | Threshold adjust, halo, extensions |
| High energy | Hundreds of keV to more than 10 MeV | Retrograde wells, deep isolation, CMOS image sensor photodiodes, power devices |
| Plasma doping | Below 1 keV; conformal | FinFET and nanosheet surfaces, 3D NAND, ultra-shallow junctions |
High-energy demand has grown fastest. CMOS image sensors need deep photodiode implants to collect light, and power devices need deep, heavily doped regions; both pushed Axcelis to build tools well above 10 MeV. Memory makers also use high-energy implants for isolation in DRAM and 3D NAND.
Where dopants go
Implants Cluster in the Transistor Tier
A logic wafer goes through 20 to 40 implant steps, almost all of them in the transistor tier before the first metal layer. Each needs its own lithography mask to block the regions that must not be doped, so implant is one of the main reasons for the noncritical mask layers in a process. Most of those masks are printed on older deep-ultraviolet (DUV) scanners; see Photolithography.
Implanter vendors
Two Massachusetts Factories Supply Most Implanters
Ion implantation is the one front-end tool class still built mostly in the United States. Applied Materials, through the Varian Semiconductor business it bought in 2011, is the largest supplier and covers every class. Axcelis is the independent specialist, strongest in high energy and silicon carbide. Their factories in Gloucester and Beverly, Massachusetts, sit about 15 miles apart.
- Made in US
- US planned
- Made abroad
| Vendor | Headquarters | Platforms | Where tools are built | US status |
|---|---|---|---|---|
| Applied Materials (Varian) | Santa Clara, CA; implant in Gloucester, MA | VIISta high current, medium current and high energy; PLAD | US | Made in US |
| Axcelis Technologies | Beverly, MA | Purion high current, medium current, high energy and SiC power series | US; South Korea from 2H 2028 | Made in US |
| SMIT (Sumitomo Heavy Industries Ion Technology) | Tokyo, Japan | High current and medium current, mainly for Japanese fabs | Japan | Made abroad |
| Nissin Ion Equipment | Kyoto, Japan | Implanters for flat-panel displays and power devices | Japan | Made abroad |
| Kingstone Semiconductor (Wanye) | Shanghai, China | 300mm high current and medium current | China | Made abroad |
| CETC Equipment Group | Beijing, China | Medium current and specialty implanters | China | Made abroad |
Axcelis reported $199 million of revenue in the first quarter of 2026, nearly three quarters of it from Asia. In October 2026 it broke ground on a $35 million plant in Pyeongtaek, South Korea, near Samsung's largest fab campus, with production planned for the second half of 2028. Its all-stock merger with Veeco Instruments, approved by both companies' shareholders in February 2026, still awaits clearance from China's State Administration for Market Regulation (SAMR), the last approval outstanding. Tool families are on Implant and Doping Equipment.
Annealing
Every Implant Needs an Anneal
| Method | Temperature and time | Use |
|---|---|---|
| Furnace anneal | 600 to 1,100 °C; minutes to hours, batch | Mature nodes, power devices, specialty |
| Rapid thermal anneal (RTA) | 900 to 1,100 °C; seconds, single wafer | Standard activation in most CMOS flows |
| Spike anneal | About 1,050 °C peak; below one second | Shallow junctions with little diffusion |
| Flash or millisecond anneal | Up to about 1,300 °C; milliseconds, flash lamp | Leading-edge source and drain activation |
| Laser anneal | Near melting at the surface; nanoseconds to microseconds | The shallowest junctions; 3D NAND and advanced logic |
An implant leaves dopant atoms in the wrong places in the crystal and damages the lattice along each ion's path. Annealing repairs the damage and moves the dopants onto lattice sites, where they conduct. The trade-off is diffusion: the same heat that activates dopants also spreads them. As junctions shrank to a few nanometers, anneals moved from hours in a furnace to milliseconds under a flash lamp or laser.
Anneal tools come from Applied Materials (Vantage RTP and laser anneal), Mattson Technology (millisecond flash anneal; owned by Beijing E-Town Dragon), SCREEN (flash lamp anneal), Veeco (laser anneal) and Kokusai Electric (batch furnaces). Several share platforms with oxidation.
Advanced nodes
3D Transistors Moved Doping Into Epitaxy and Plasma
- Shallower junctions: extensions in leading-edge logic are a few nanometers deep, which takes sub-keV implants, germanium or carbon pre-amorphization, and millisecond or laser anneals.
- 3D surfaces: a beam arrives from one direction, but fins and stacked nanosheets need doping on every face. That moved much of the source and drain doping into in-situ doped epitaxy and plasma doping.
- Isolation in gate-all-around: TSMC N2, Intel 18A and Samsung SF2 nanosheet transistors need implants under the stack to keep the substrate from conducting, plus doping steps tied to backside power delivery at Intel 18A and TSMC A16.
- Memory: DRAM and 3D NAND use many high-energy and high-dose implants, so memory capex swings move implanter orders more than logic does.
SiC doping
Silicon Carbide Can Only Be Doped by Hot Implants
Silicon carbide does not let dopants diffuse at any practical temperature, so every doped region in a SiC power MOSFET must be implanted. Implants run with the wafer heated to 500 °C or more to limit lattice damage, using aluminum for p-type and nitrogen or phosphorus for n-type regions. Activation then needs an anneal above 1,600 °C with a carbon cap to keep the surface from breaking down.
Axcelis built its Purion power series around this market, and the 2023 to 2024 SiC fab buildout drove much of its growth. High-temperature anneal furnaces come from Centrotherm and others. Device context is on SiC and GaN Power Modules.
China
China Is Building Implanters but Still Imports Most
Implanters are one of the last front-end tools China can make only in part. Kingstone Semiconductor, Hwatsing Technology, NAURA, CETC and Shuoke Zhongketai now ship 300mm high-current and medium-current tools aimed at 28nm and coarser processes. In January 2026 the China Institute of Atomic Energy unveiled the POWER-750H, the first domestic tandem high-energy hydrogen implanter, built for IGBT power devices.
Imports still dominate. US-made tools were about 40% of the ion implanters China imported by unit in the first four months of 2026, with Japan and Singapore most of the rest. The pending Axcelis-Veeco merger needs China's SAMR approval for the same reason: Chinese fabs are among both companies' largest customers.
Record
Page Record
- Covers
- Dopant species, doping methods, ion implantation and implanter classes, CMOS implant regions, implanter vendors, annealing, advanced-node and SiC doping, China
- Sources
- Axcelis Form 10-Q for the quarter ended March 31, 2026; ION Analytics (Axcelis-Veeco SAMR review, March 2026); Tech Times (Axcelis Pyeongtaek groundbreaking, October 21, 2026); China Daily (POWER-750H, January 2026); Tiger Brokers news (China implanter makers and import shares, 2026); Applied Materials and Axcelis product pages (October 2026)
- Last verified
- October 2026